Integrated Test Management System (ITMS)
What is an Integrated Test Management System?
Integrated Test Management System (ITMS) is the name applied to an extensive and comprehensive 3-year project to upgrade the test software infrastructure at STATS ChipPAC. Internally, ITMS is used to efficiently and effectively drive test operations and test business processes. For STATS ChipPAC customers, ITMS is a generator of new services and capabilities.
ITMS for Consistency of Quality and Services
ITMS is designed to unify all the factories within the STATS ChipPAC family to deliver a “One Look, One Experience” to STATS ChipPAC customers. The ITMS core resides on corporate servers with network extensions into all the factory domains as illustrated in the figure below:
This architecture enables ITMS to manage and monitor the processes within each factory to deliver consistent quality and services to customers from all its factories.
ITMS for Automatic Process Controls
At the root of ITMS is a Next Generation Test Cell as highlighted below:
Next Generation Test Cell at STATS ChipPAC Singapore (SCS)
By adding an Automatic Test Cell Controller to the test cell, STATS ChipPAC can achieve a higher level of process control referred to as Automated Closed Loop Process Control. The closed loop process works like this:
- During a new device offload, a STATS ChipPAC product engineer encodes process controls into an ITMS Device Profile, such as:
- Auto-monitor site-to-site variation: ON
- Trigger limit for site-to-site variation: 5%
- Trigger action: Alarm and halt the tester
- Trigger message: Replace the test socket with a new test socket.
- At the test cell, when an operator scans a lot ID for this device, the Automatic Test Cell Controller loads the Device Profile for this device and continuously monitors the test results against the pre-defined controls in real time.
- If the site-to-site variation reaches the trigger limit (5% in this example), the Auto Controller automatically halts the tester, activates the alarm (lights and sound) and displays the trigger message: “Replace the test socket on test site #3 with a new test socket.”
- Replacing the faulty test socket eliminates the source of this out-of-control event and closes the process control loop.
The STATS ChipPAC Automatic Test Cell Controller supports an extensive set of process controls for total control of the manufacturing process.
For information on the many other services and capabilities enabled by ITMS, contact your STATS ChipPAC sales representative and request a presentation.